doc. no : qw0905-LHG35162 rev. : a date : 16 - feb - 2005 data sheet bipolar type led lamps LHG35162 ligitek electronics co.,ltd. property of ligitek only
2 1.0min 25.0min directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 25% 25% 0 100% 75% 50% 75% 50% 100% -60 x -30 x 0 x 60 x 30 x 2.54typ package dimensions part no. LHG35162 7.01 1.76 0.5 typ 1 1.5max 1 2 h g 1.7 1.75 3.95 ligitek electronics co.,ltd. property of ligitek only page 1/5
tstg forward voltage @20ma(v) luminous intensity @10ma(mcd) spectral halfwidth ??f nm part no material peak wave length f pnm viewing angle 2 c 1/2 (deg) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. 565 697 gap green gap LHG35162 white diffused red emitted lens 1.7 30 2.6 4.5 8.0 50 1.7 90 0.25 2.6 min. max. min. 50 0.5 typ. typical electrical & optical characteristics (ta=25 j ) color soldering temperature storage temperature tsol max 260 j for 5 sec max (2mm from body) -40 c ~ +100 c j page 2/5 part no. LHG35162 forward current i f ma 30 15 reverse current @5v operating temperature t opr ir peak forward current duty 1/10@10khz power dissipation i fp pd -40 c ~ +85 c 10 10 j g a 120 60 40 100 ma mw absolute maximum ratings absolute maximum ratings at ta=25 j parameter symbol g h unit ligitek electronics co.,ltd. property of ligitek only
relative intensity@20ma 600 0.0 0.5 wavelength (nm) 700 800 900 ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature forward voltage@20ma normalize @25 j 1.0 -20 -40 0.8 1.0 0.9 1.1 1.2 0.5 relative intensity@20ma normalize @25 j -20 ambient temperature( j ) 80 60 40 20 0-40 100 0.0 80 60 02040 100 fig.4 relative intensity vs. temperature 2.5 1.5 1.0 2.0 3.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 forward current(ma) 0.1 1.0 1.0 10 1000 h chip relative intensity normalize @20ma forward voltage(v) 2.0 3.0 4.0 5.0 1.0 0.0 1.5 1.0 0.5 2.0 2.5 forward current(ma) 10 100 1000 fig.2 relative intensity vs. forward current 3.0 ligitek electronics co.,ltd. property of ligitek only 1000 3/5 part no. LHG35162 page
4/5 fig.6 directive radiation part no. LHG35162 g chip 3.5 3.0 2.5 1.5 1.0 0.5 0.0 2.0 60 100 80 02040 -40 -20 0.9 0.8 100 80 5.0 4.0 3.0 2.0 1.0 0.5 0.0 650 600 550 500 1.2 1.1 1.0 60 40 20 0 -20 -40 3.0 2.5 2.0 1.5 1.0 0.5 0.0 1000 100 10 1.0 1000 100 10 1.0 0.1 1.0 ligitek electronics co.,ltd. property of ligitek only relative intensity normalize @20ma fig.2 relative intensity vs. forward current forward current(ma) page forward current(ma) fig.1 forward current vs. forward voltage forward voltage(v) typical electro-optical characteristics curve relative intensity@20ma normalize @25 j ambient temperature( j ) fig.4 relative intensity vs. temperature forward voltage@20ma normalize @25 j wavelength (nm) relative intensity@20ma ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature
mil-std-202:103b jis c 7021: b-11 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs the purpose of this test is the resistance of the device under tropical for hous. high temperature high humidity test this test intended to see soldering well performed or not. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec thermal shock test solder resistance test 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. reliability test: operating life test test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only part no. LHG35162 page 5/5
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